霍普金森装置校准高应变率标准样品研制

DEVELOPMENT OF HIGH STRAIN RATE STANDARD SAMPLES FOR HOPKINSON DEVICE CALIBRATION

  • 摘要: 为满足霍普金森装置校准工作的需要,研制了高应变率校准标准样品,围绕降低样品高应变率下试验结果的离散性,从样品选材、界面控制、晶粒细化3方面展开研究。研究表明,低硬度纯铜材料适合制作霍普金森杆校准标准样品,通过控制样品平行度及端面摩擦,利用等通道转角挤压方法进行晶粒细化,制作的标准样品在高应变率下的试验结果具有良好一致性。随着应变速率提高,纯铜晶粒尺寸呈增大趋势,高应变速率下的纯铜标准样品均为超细晶粒组织,试验结果离散性小,可满足霍普金森装置校准工作需要。

     

    Abstract: In order to conduct the Hopkinson device calibration work, a high strain rate calibration standard sample has been developed. Focusing on reducing the discreteness of test results under high strain rates, analysis has been conducted from three aspects: sample selection, external interface control, and internal grain refinement. Research has shown that low hardness pure copper materials are suitable for producing Hopkinson rod calibration standard samples. By strictly controlling sample parallelism and face friction, and using equal channel angular compression method for grain refinement, the standard samples produced have good consistency in experimental results at high strain rates. With the increase of strain rate, the grain size of pure copper shows an increasing trend. The pure copper standard samples under high strain rate are ultrafine grain structure, and the dispersion of test results is small, which can satisfy the requirements of Hopkinson device calibration work.

     

/

返回文章
返回